variable pressure scanning electron microscope (vp-sem Search Results


variable pressure scanning electron microscope (vp-sem  (Hitachi Ltd)
90
Hitachi Ltd variable pressure scanning electron microscope (vp-sem
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Variable Pressure Scanning Electron Microscope (Vp Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable pressure scanning electron microscope (vp-sem/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
variable pressure scanning electron microscope (vp-sem - by Bioz Stars, 2026-03
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variable-pressure scanning electron microscope vp-sem 1455  (JEOL)
90
JEOL variable-pressure scanning electron microscope vp-sem 1455
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Variable Pressure Scanning Electron Microscope Vp Sem 1455, supplied by JEOL, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable-pressure scanning electron microscope vp-sem 1455/product/JEOL
Average 90 stars, based on 1 article reviews
variable-pressure scanning electron microscope vp-sem 1455 - by Bioz Stars, 2026-03
90/100 stars
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variable pressure scanning electron microscope model 1455 vpsem  (Carl Zeiss)
90
Carl Zeiss variable pressure scanning electron microscope model 1455 vpsem
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Variable Pressure Scanning Electron Microscope Model 1455 Vpsem, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable pressure scanning electron microscope model 1455 vpsem/product/Carl Zeiss
Average 90 stars, based on 1 article reviews
variable pressure scanning electron microscope model 1455 vpsem - by Bioz Stars, 2026-03
90/100 stars
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s-2600n variable pressure scanning electron microscope (vpsem  (Hitachi Ltd)
90
Hitachi Ltd s-2600n variable pressure scanning electron microscope (vpsem
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
S 2600n Variable Pressure Scanning Electron Microscope (Vpsem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/s-2600n variable pressure scanning electron microscope (vpsem/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
s-2600n variable pressure scanning electron microscope (vpsem - by Bioz Stars, 2026-03
90/100 stars
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variable pressure scanning electron microscope (sem)&energy dispersive x-ray (edx) vpsem/edx; zeiss evo ls10  (Carl Zeiss)
90
Carl Zeiss variable pressure scanning electron microscope (sem)&energy dispersive x-ray (edx) vpsem/edx; zeiss evo ls10
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Variable Pressure Scanning Electron Microscope (Sem)&Energy Dispersive X Ray (Edx) Vpsem/Edx; Zeiss Evo Ls10, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable pressure scanning electron microscope (sem)&energy dispersive x-ray (edx) vpsem/edx; zeiss evo ls10/product/Carl Zeiss
Average 90 stars, based on 1 article reviews
variable pressure scanning electron microscope (sem)&energy dispersive x-ray (edx) vpsem/edx; zeiss evo ls10 - by Bioz Stars, 2026-03
90/100 stars
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variable pressure scanning electron microscope 1455 vpsem  (Carl Zeiss)
90
Carl Zeiss variable pressure scanning electron microscope 1455 vpsem
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Variable Pressure Scanning Electron Microscope 1455 Vpsem, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable pressure scanning electron microscope 1455 vpsem/product/Carl Zeiss
Average 90 stars, based on 1 article reviews
variable pressure scanning electron microscope 1455 vpsem - by Bioz Stars, 2026-03
90/100 stars
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s 4300se/n variable pressure scanning electron microscope (vp sem  (Hitachi Ltd)
90
Hitachi Ltd s 4300se/n variable pressure scanning electron microscope (vp sem
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
S 4300se/N Variable Pressure Scanning Electron Microscope (Vp Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/s 4300se/n variable pressure scanning electron microscope (vp sem/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
s 4300se/n variable pressure scanning electron microscope (vp sem - by Bioz Stars, 2026-03
90/100 stars
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su1510 variable pressure scanning electron microscope (vp-sem  (Hitachi Ltd)
90
Hitachi Ltd su1510 variable pressure scanning electron microscope (vp-sem
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Su1510 Variable Pressure Scanning Electron Microscope (Vp Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/su1510 variable pressure scanning electron microscope (vp-sem/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
su1510 variable pressure scanning electron microscope (vp-sem - by Bioz Stars, 2026-03
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variable-pressure scanning electron microscope (vpsem) merlin compact  (Carl Zeiss)
90
Carl Zeiss variable-pressure scanning electron microscope (vpsem) merlin compact
Chemical characterization of untreated EFB, isolated cellulose and CNF EFB on ( a ) FTIR, ( b ) XRD spectrum, ( c ) the zeta potentials and ( d ) <t>VPSEM-EDS.</t>
Variable Pressure Scanning Electron Microscope (Vpsem) Merlin Compact, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable-pressure scanning electron microscope (vpsem) merlin compact/product/Carl Zeiss
Average 90 stars, based on 1 article reviews
variable-pressure scanning electron microscope (vpsem) merlin compact - by Bioz Stars, 2026-03
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variable-pressure scanning electron microscope (vp-sem  (Hitachi Ltd)
90
Hitachi Ltd variable-pressure scanning electron microscope (vp-sem
Chemical characterization of untreated EFB, isolated cellulose and CNF EFB on ( a ) FTIR, ( b ) XRD spectrum, ( c ) the zeta potentials and ( d ) <t>VPSEM-EDS.</t>
Variable Pressure Scanning Electron Microscope (Vp Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable-pressure scanning electron microscope (vp-sem/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
variable-pressure scanning electron microscope (vp-sem - by Bioz Stars, 2026-03
90/100 stars
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variable pressure scanning electron microscope (vp-sem) s-3400n  (Hitachi Ltd)
90
Hitachi Ltd variable pressure scanning electron microscope (vp-sem) s-3400n
Chemical characterization of untreated EFB, isolated cellulose and CNF EFB on ( a ) FTIR, ( b ) XRD spectrum, ( c ) the zeta potentials and ( d ) <t>VPSEM-EDS.</t>
Variable Pressure Scanning Electron Microscope (Vp Sem) S 3400n, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable pressure scanning electron microscope (vp-sem) s-3400n/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
variable pressure scanning electron microscope (vp-sem) s-3400n - by Bioz Stars, 2026-03
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s-3600n variable pressure scanning electron microscope (vp-sem  (Hitachi Ltd)
90
Hitachi Ltd s-3600n variable pressure scanning electron microscope (vp-sem
Chemical characterization of untreated EFB, isolated cellulose and CNF EFB on ( a ) FTIR, ( b ) XRD spectrum, ( c ) the zeta potentials and ( d ) <t>VPSEM-EDS.</t>
S 3600n Variable Pressure Scanning Electron Microscope (Vp Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/s-3600n variable pressure scanning electron microscope (vp-sem/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
s-3600n variable pressure scanning electron microscope (vp-sem - by Bioz Stars, 2026-03
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Image Search Results


Scanning electron microscopy (SEM) and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).

Journal: Plants

Article Title: Antioxidant Responses of Phenolic Compounds and Immobilization of Copper in Imperata cylindrica , a Plant with Potential Use for Bioremediation of Cu Contaminated Environments

doi: 10.3390/plants9101397

Figure Lengend Snippet: Scanning electron microscopy (SEM) and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).

Article Snippet: In order to localize the Cu-bound to the shoot and root tissues, plants with 21 days of growth were observed by Variable Pressure Scanning Electron Microscope (VP-SEM), with transmission module STEM SU-3500 (Hitachi, Tokyo, Japan).

Techniques: Electron Microscopy

Chemical characterization of untreated EFB, isolated cellulose and CNF EFB on ( a ) FTIR, ( b ) XRD spectrum, ( c ) the zeta potentials and ( d ) VPSEM-EDS.

Journal: Scientific Reports

Article Title: Telescopic synthesis of cellulose nanofibrils with a stable dispersion of Fe(0) nanoparticles for synergistic removal of 5-fluorouracil

doi: 10.1038/s41598-019-48274-2

Figure Lengend Snippet: Chemical characterization of untreated EFB, isolated cellulose and CNF EFB on ( a ) FTIR, ( b ) XRD spectrum, ( c ) the zeta potentials and ( d ) VPSEM-EDS.

Article Snippet: The pre- and post-processing morphologies of the sample were observed using a variable-pressure scanning electron microscope (VPSEM) (Merlin Compact, Zeiss Pvt Ltd., Oberkochen, Germany), while the Fe(II) residues in the final sample identified using energy-dispersive analysis spectroscopy (EDS).

Techniques: Isolation